Telinc WAN Tester III is a sophisticated bit error rate tester in a compact,
hand held package. It can test a wide variety of communications facilities and
equipment including T-1, fractional T-1, E-1, fractional E-1, T-3 and E-3
modems, multiplexers, CSU/DSUs, T-1 CSUs, DTUs, NTUs and TIUs. It is supplied
with user changeable nickel metal hydride batteries and a built-in charger.
Dual T-1 and E-1 Testing
the T-1 and E-1 modes, the Testerdisplays bit errors, transmit and receivefrequency, test
seconds, bit error rate andG.821 performance measurements. Avariety of test
patterns can be inserted in allor selected DS0s/TimeSlots, continuous ornon-contiguous,
making the Tester ideal forfractional T-1 or E-1 testing. Because itcontains two
T-1/E-1framers, it can measurebit and frame slips as well as monitor andlisten to both the
TX and RX DS0s andTimeSlots
simultaneously. It can alsoperform Drop/Insert (D/I) testing a singleDS0 or TimeSlot
without interfereing withthe remaining ones
Dual T-3 and E-3 Testing
WAN Tester III can test T-3 and E-3 networks and CSUs. It performs G.821 measurements
and displays bit errors, bit error rate, frequency and more. With the dual
T-3/E-3 TX and RX framers and codecs, it can monitor both sides of the line so
it can listen to voice on a DS0 or Timeslot on a channelized T-3/E-3.
Asynchronous and Synchronous Testing
the async and sync test mode, the Tester generates test data in a choice of patterns
and formats. The user can choose from twenty-eight async and seventy-five sync
test speeds. In the async mode, it displays characters received, character
errors and errored seconds. In the sync mode, it displays bit errors, bit error
rate, TX frequency, RX frequency, CTS delay, G.821 measurements and more.
WAN Tester III can generate and store reports useful for line turnovers, troubleshooting
in the lab or diagnosing a communication line issue.
Easy to use
WAN Tester III can be controlled from the front panel or from a local or remote
terminal. It includes a 320 x 240 Color LCD display that shows selected mode,
test and operating parameters. Parameters are selected by scrolling through
values stored in the Tester.